Bevan Baas; University of California, Davis, USA Edith Beigne; CEA-Leti, France Andrew Carter; Teledyne Scientific and Imaging Bing Chen; Zhejiang University, China Séverine Chéramy; CEA-Leti, France John Ellis-Monaghan; GLOBALFOUNDRIES, USA Paul Franzon; North Carolina State University, USA Masahide Goto; NHK Science and Technology Research Laboratories, Tokyo, Japan Genquan Han; Xidian University, China Masanori Hashimoto; Osaka University, Japan Sebastien Hoeppner; RACYICS/Technische Universität Dresden, Germany Paul Hurwitz; TowerJazz, USA Adrian Ionescu; Ėcole Polytechnique Fédérale Lausanne, Switzerland Xiangwei Jiang; Chinese Academy of Science, China Masahara Kobayashi;, University of Tokyo, Japan Kai-Shin Li; National Chiao Tung University, Taiwan

Jean-Pierre Raskin; Université catholique de Louvain, Belgium Carlos Reita; CEA-Leti, France Sayeef Salahuddin; University of California, Berkeley, USA Walter Schwarzenbach; SOITEC, France Davood Shahrjerdi; New York University, USA Douglas Sheldon; Jet Propulsion Lab, USA Hani Sherry; TiHive, France Nikhil Shukla; University of Virginia, USA Henry Smith; Massachusetts Institute of Technology, USA Pin Su; National Chiao Tung University, Taiwan Dennis Sylvester; University of Michigan, Ann Arbor, USA Jamie Teherani; Columbia University, USA Anne Vandooren; imec, Belgium Hitoshi Wakabayashi; Tokyo Institute of Technology, Japan Piet Wambacq; imec, Belgium Peter Ye; Purdue University, USA SJ Ben Yoo; University of California, Davis, USA Long You; Huazhong University of Science and Technology, China Yi Zhao; Zhejiang University, Hangzhou, China